HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY OF G EXSI1-X SUPERLATTICES

Citation
An. Stepanov et Av. Kornilov, HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY OF G EXSI1-X SUPERLATTICES, Kristallografia, 39(4), 1994, pp. 693-695
Citations number
10
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00234761
Volume
39
Issue
4
Year of publication
1994
Pages
693 - 695
Database
ISI
SICI code
0023-4761(1994)39:4<693:HXOGES>2.0.ZU;2-U