AN ANGLE-SCANNED PHOTOELECTRON DIFFRACTION STUDY ON THE SURFACE RELAXATION OF ZNO(0001)

Authors
SAMBI M GRANOZZI G RIZZI GA CASARIN M TONDELLO E
Citation
M. Sambi et al., AN ANGLE-SCANNED PHOTOELECTRON DIFFRACTION STUDY ON THE SURFACE RELAXATION OF ZNO(0001), Surface science, 319(1-2), 1994, pp. 149-156
Citations number
28
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
319
Issue
1-2
Year of publication
1994
Pages
149 - 156
Database
ISI
SICI code
0039-6028(1994)319:1-2<149:AAPDSO>2.0.ZU;2-T
Abstract
An angle-scanned X-ray photoelectron diffraction (XPD) study of the po lar Zn-terminated ZnO(0001) surface has been carried out in order to l ook for a hypothetical inward relaxation of the outermost Zn layer. Fr om the comparison of the O Is polar scan with single-scattering-cluste r (SSC) simulations it is clearly evident that the surface is bulk ter minated and any relaxation is ruled out. Moreover, the capability of t he XPD technique in determining the surface polarity (atomic terminati on)by inspection of theta/phi 2D plots without the aid of theoretical simulations has been demonstrated.