COINCIDENCE COUNTING ANALYSIS OF SECONDARY IONS EMITTED FROM A PHENYLALANINE TARGET UNDER MULTICHARGED MEV CARBON BOMBARDMENT

Coincidence counting techniques for time-of-flight mass spectrometry h ave been applied to the study of secondary ion correlations. Phenylala nine samples were exposed to 2.5 MeV carbon ions with charge states ra nging from +1 to +6. The influences of the projectile charge state on secondary ion yields and correlations are reported. The degree of seco ndary ion correlation was observed to decrease as the charge state of the primary ion increases. For the cases studied, the data indicate th at more inefficient projectiles are better suited for monitoring secon dary ion correlations.