XPS INVESTIGATIONS OF THE REACTIVITIES OF OXIDIZED ZR NB INTERFACES FORMED BY DEPOSITION ON A GOLD SUBSTRATE/

The interaction of a film of Zr (similar to 38 Angstrom thick) deposit ed under ultrahigh vacuum (UHV) on to an approximately 12 Angstrom fil m of NbO on a gold substrate has been studied with X-ray photoelectron spectroscopy (XPS). Evidence is presented for an interfacial conversi on from Zr and NbO to ZrO2 and Nb. The reactivity of this sample was s tudied through a series of sequential treatments. Although changes occ ur in the topmost layer, the Zr/Nb interfacial region, as identified b y a shoulder at similar to 180 eV in Zr 3d and the 203.0 eV peak in Nb 3d, appears to be remarkably inert on heating at 300 degrees C under UHV, as well as on subjecting to O-2 and hydrogen plasma treatments.