EXPONENTIAL CURVATURE-COMPENSATED BICMOS BANDGAP REFERENCES

Authors
Citation
I. Lee et al., EXPONENTIAL CURVATURE-COMPENSATED BICMOS BANDGAP REFERENCES, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1396-1403
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189200
Volume
29
Issue
11
Year of publication
1994
Pages
1396 - 1403
Database
ISI
SICI code
0018-9200(1994)29:11<1396:ECBBR>2.0.ZU;2-4
Abstract
An exponential curvature compensation technique for bandgap references (BGR's) which exploits the temperature characteristics of the current gain beta of a bipolar transistor is described. This technique requir es no additional circuits for the curvature compensation; only a size adjustment of a bias transistor in a conventional first-order compensa ted BGR is required. Positive and negative versions of the exponential curvature-compensated BGR have been fabricated using 1.5-mu m BiCMOS process. Average temperature coefficients (TC's) of the negative BGR a re measured as 2.4 and 6.7 ppm/degrees C, and those of the positive BG R are measured as 3.5 and 8.9 ppm/degrees C over the commercial (0 sim ilar to 70 degrees C) and military (-55 similar to 125 degrees C) temp erature ranges, respectively. These circuits dissipate 0.37 mW with a 5-V single supply, and occupy 270 x 150 mu m(2) and 290 x 150 mu m(2), respectively.