A 12-b, 10-MHz, 250-mW, four-stage analog-to-digital converter (ADC) w
as implemented using a 0.8-mu m p-well CMOS technology, The ADC based
on a digitally calibrated multiplying digital-to-analog converter (MDA
C) selectively employs a binary-weighted capacitor array in the front-
end stage and a unit-capacitor array in the remaining back-end stages
to obtain 12 b level linearity while maintaining high yield, All the a
nalog and digital circuit functional blocks are fully integrated on a
single chip, which occupies a die area of 15 mm(2) (4,2 mm x 3.6 mm),
Measured differential nonlinearity (DNL) and integral nonlinearity (IN
L) of the prototype are less than +/-0.8 LSE and +/-1.8 LSB, respectiv
ely.