CHARACTERIZATION OF ADSORPTION IN FLOW-TYPE ATOMIC LAYER EPITAXY REACTOR

Authors
Citation
J. Aarik et H. Siimon, CHARACTERIZATION OF ADSORPTION IN FLOW-TYPE ATOMIC LAYER EPITAXY REACTOR, Applied surface science, 81(3), 1994, pp. 281-287
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
81
Issue
3
Year of publication
1994
Pages
281 - 287
Database
ISI
SICI code
0169-4332(1994)81:3<281:COAIFA>2.0.ZU;2-2
Abstract
Numerical model calculations describing the propagation of an adsorpti on wave in a low-pressure channel-type ALE reactor are carried out. Th e effect of channel parameters and flow rate of the carrier gas as wel l as diffusion and sticking coefficients of the precursor on the propa gation of the adsorption wave are studied. It is shown that the surfac e density of adsorption sites and the diffusion coefficient of the pre cursor molecules can be determined from the precursor pulse delay time measurements. Using the time dependence of the precursor concentratio n or that of the surface coverage, both measured at the channel outlet , the sticking coefficient of the precursor can be calculated.