STUDY OF LAYER DISORDER AND OTHER MICROSTRUCTURAL PARAMETERS IN INSE THIN-FILMS

Authors
BANERJEE N SAMANTARAY BK CHAUDHURI AK
Citation
N. Banerjee et al., STUDY OF LAYER DISORDER AND OTHER MICROSTRUCTURAL PARAMETERS IN INSE THIN-FILMS, Journal of materials science letters, 13(20), 1994, pp. 1443-1445
Citations number
20
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
13
Issue
20
Year of publication
1994
Pages
1443 - 1445
Database
ISI
SICI code
0261-8028(1994)13:20<1443:SOLDAO>2.0.ZU;2-M