Zw. Lu et al., COMPARISON OF EXPERIMENTAL AND THEORETICAL ELECTRONIC CHARGE-DISTRIBUTIONS IN GAMMA-TIA1, Acta metallurgica et materialia, 42(12), 1994, pp. 3929-3943
Using critical voltage electron diffraction, Fox has recently determin
ed the lowest seven X-ray structure factors of gamma-TiAl (L1(0) struc
ture). We present here a comparison of these accurately measured (0.15
%) structure factors with first-principles local density calculations,
finding an agreement within 0.7% and an r.m.s. error of 0.013 e/atom.
While such measurements are limited to the first few structure factor
s rho(G) (where G is the crystal momentum), theory is able to obtain r
ho(G) for arbitrarily high G. If we construct charge density deformati
on maps by Fourier summations up to the lowest measured G, the calcula
ted and experimental density deformation maps agree very closely. Howe
ver, if we include in the theoretical density deformation map high G v
alues (outside the range accessible to experiment), qualitatively diff
erent bonding patterns appear, in particular between Ti atoms. Systema
tic study of the total, valence, and deformation charge densities as w
ell as comparison with result for NiAl in the hypothetical L1(0) struc
ture elucidate the bonding patterns in these transition metal aluminid
es.