IN-SITU MONITORING OF ELECTRODE SURFACE MODIFICATION VIA CONFOCAL SCANNING BEAM LASER MICROSCOPY

Citation
Zh. Gu et al., IN-SITU MONITORING OF ELECTRODE SURFACE MODIFICATION VIA CONFOCAL SCANNING BEAM LASER MICROSCOPY, Journal of the Electrochemical Society, 141(11), 1994, pp. 120000153-120000155
Citations number
6
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
141
Issue
11
Year of publication
1994
Pages
120000153 - 120000155
Database
ISI
SICI code
0013-4651(1994)141:11<120000153:IMOESM>2.0.ZU;2-J
Abstract
A new approach is presented for the monitoring of surface modification during the oxidation or reduction of metals in electrode reactions. T his nonintrusive technique is based on the combination of confocal sca nning beam laser microscopy and electrochemical measurements, and it a llows an in situ characterization of 3-D surface morphology on a micro metric scale.