D. Hueber et al., ARGON FLUORIDE LASER-EXCITED ATOMIC FLUORESCENCE OF ARSENIC IN A H-2 AIR FLAME AND IN AN AR ICP, Applied spectroscopy, 48(10), 1994, pp. 1213-1217
Laser-excited atomic fluorescence spectrometry (LEAFS) can be an extre
mely sensitive method of trace analysis. However, some elements, such
as As, have strong absorption lines only below 200 nm. Dye laser syste
ms capable of resonance excitation of As are complicated and very expe
nsive. By coincidence, a simple fixed-frequency argon fluoride (ArF) e
xcimer laser produces a broad-band output centered at 193.0-193.2 nm o
verlapping the As absorption line at 193.7 nm. The use of an ArF excim
er laser as a source for LEAFS detection of As in a H-2/air flame and
an Ar-ICP has been evaluated. Detection limits of about 20 ng/mL were
obtained with both atomizers. The limiting noise was laser-induced sca
tter in both cases. Methods of improving the detection powers are disc
ussed.