The V2O5(001) surface is examined by means of X-ray photoelectron forw
ard scattering (XPFS) with a grazing detection angle for enhanced surf
ace sensitivity. The V2p(3/2) photoelectron peak is decomposed into tw
o components, labeled V5+ and V4+, Which reflect the unreduced V2O5 su
rface crystallography and its surface modification or photoreduction,
respectively. Azimuthal scans are presented for a freshly introduced V
2O5 sample, displaying maxima due to forward scattering. These feature
s can be identified by considering the V2O5 interatomic directions.