X-RAY PHOTOELECTRON FORWARD SCATTERING STUDY OF VANADIUM-OXIDES

Authors
POELMAN H FIERMANS L
Citation
H. Poelman et L. Fiermans, X-RAY PHOTOELECTRON FORWARD SCATTERING STUDY OF VANADIUM-OXIDES, Solid state communications, 92(8), 1994, pp. 669-673
Citations number
4
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
92
Issue
8
Year of publication
1994
Pages
669 - 673
Database
ISI
SICI code
0038-1098(1994)92:8<669:XPFSSO>2.0.ZU;2-I
Abstract
The V2O5(001) surface is examined by means of X-ray photoelectron forw ard scattering (XPFS) with a grazing detection angle for enhanced surf ace sensitivity. The V2p(3/2) photoelectron peak is decomposed into tw o components, labeled V5+ and V4+, Which reflect the unreduced V2O5 su rface crystallography and its surface modification or photoreduction, respectively. Azimuthal scans are presented for a freshly introduced V 2O5 sample, displaying maxima due to forward scattering. These feature s can be identified by considering the V2O5 interatomic directions.