E. Pawlowski et B. Kuhlow, ANTIREFLECTION-COATED DIFFRACTIVE OPTICAL-ELEMENTS FABRICATED BY THIN-FILM DEPOSITION, Optical engineering, 33(11), 1994, pp. 3537-3546
The use of thin-film deposition in the fabrication of antireflection-c
oated diffractive optical elements is discussed. The antireflection co
atings for these diffractive elements are optimized on the basis of an
angular spectrum approach and the method of characteristic matrices.
A minimum reflectivity as low as 1x10(-4) is realized using in situ co
ntrolled multilayers of TiO2 and SiO2. The blazed profile of the diffr
active optical elements is approximated by a stepped profile with up t
o 32 phase levels. The highest measured diffraction efficiency for 32-
level Fresnel zone lenses was 97%.