Mw. Smith et Sf. Biggar, CALIBRATION AND PERFORMANCE EVALUATION OF A PORTABLE SHORTWAVE INFRARED (1.05-MU-M TO 2.45-MU-M) SPECTROMETER, Optical engineering, 33(11), 1994, pp. 3781-3792
A portable shortwave infrared (SWIR) spectrometer has been developed t
hat covers the range from 1.05 to 2.45 mu m. The spectral sampling int
erval is 1.37 nm, and the spectral resolution can be varied from about
5 nm to more than 100 nm. A single spectrum can be acquired in as lit
tle as 1 s. The signal-to-noise ratio (SNR) for a single 1-s scan is a
bout 100 at a wavelength of 2.2 mu m for a lambertian surface of 100%
reflectance illuminated by the sun at normal incidence with 14-nm spec
tral resolution. The SNR at 1.25 mu m is about 900 for the same condit
ions. The estimated la uncertainty in the absolute radiometric calibra
tion of the instrument is 2% to 3%. Field-of-view defining optics are
coupled by a flexible fiber optic bundle to the spectrometer, which co
nsists of a nonscanning concave holographic diffraction grating with a
flat focal field imaged onto a 1024-element liquid nitrogen cooled Pt
Si linear array detector. The primary use for the instrument is the co
llection of ground reflectance and radiance data for the radiometric c
alibration of operational and proposed high spectral resolution remote
sensing systems.