RECENT ADVANCES IN ELECTRON PHASE MICROSCOPY

Authors
TONOMURA A
Citation
A. Tonomura, RECENT ADVANCES IN ELECTRON PHASE MICROSCOPY, Surface science reports, 20(7-8), 1994, pp. 317-364
Citations number
77
Categorie Soggetti
Chemistry Physical
Journal title
Surface science reports → ACNP
ISSN journal
01675729
Volume
20
Issue
7-8
Year of publication
1994
Pages
317 - 364
Database
ISI
SICI code
0167-5729(1994)20:7-8<317:RAIEPM>2.0.ZU;2-6
Abstract
Electron microscopy utilizing the phase information of an electron bea m has recently seen remarkable progress due to the development of a '' coherent'' field-emission electron beam and the corresponding image-pr ocessing techniques. This paper reviews these developments and their a pplications.