SELF-ASSEMBLY OF N-ALKANETHIOLATE MONOLAYERS ON SILVER NANOSTRUCTURES- DETERMINATION OF THE APPARENT THICKNESS OF THE MONOLAYER BY SCANNING-TUNNELING-MICROSCOPY
Wj. Li et al., SELF-ASSEMBLY OF N-ALKANETHIOLATE MONOLAYERS ON SILVER NANOSTRUCTURES- DETERMINATION OF THE APPARENT THICKNESS OF THE MONOLAYER BY SCANNING-TUNNELING-MICROSCOPY, Journal of physical chemistry, 98(45), 1994, pp. 11751-11755
The scanning tunneling microscope (STM) is employed to monitor the eff
ect of adsorption of an n-alkanethiolate monolayer, from an aqueous so
lution of the thiol, on the apparent topography of nanoscopic silver a
dsorption sites. Silver nanodisk structures, 1000-1500 Angstrom in dia
meter and 50- 150 A in height, were electrochemically deposited on gra
phite surfaces by using the STM. The topography of these adsorption si
tes was then determined in situ by STM imaging prior to the exposure o
f the nanostructure to an aqueous solution of an n-alkanethiol. Immedi
ately following exposure to the thiol, STM images revealed an increase
in the height of the nanostructure resulting from the self-assembly o
f an n-alkanethiolate monolayer on the silver surface. The apparent th
ickness of the self-assembled monolayer (SAM), estimated from the diff
erence in the nanostructure height measured before and after adsorptio
n of the monolayer, increased linearly with the alkyl chain length for
five n-alkanethiols (i.e., CnH(2n+1)SH) having even-numbered chain le
ngths from n = 10 to 18. For SAMs of tetradecanethiol (CH3(CH2)(13)SH)
, hexadecanethiol (CH3(CH2)(15)SH), and octadecanethiol (CH3(CH2)(17)S
H), the average height increments (20, 24, and 28 Angstrom, respective
ly) equaled the expected all-trans chain length of these molecules wit
hin the experimental precision of our measurement, indicating that lit
tle penetration of the STM tip into the surface of the monolayer occur
s during the STM imaging experiment.