IMAGING CRYSTAL-GROWTH FEATURES USING SCANNING FORCE MICROSCOPY (SFM)

Authors
KIPP S KAMMER S LACMANN R ROLFS J TANNEBERGER U BECKMANN W
Citation
S. Kipp et al., IMAGING CRYSTAL-GROWTH FEATURES USING SCANNING FORCE MICROSCOPY (SFM), Crystal research and technology, 29(7), 1994, pp. 1005-1011
Citations number
23
Categorie Soggetti
Crystallography
Journal title
Crystal research and technology → ACNP
ISSN journal
02321300
Volume
29
Issue
7
Year of publication
1994
Pages
1005 - 1011
Database
ISI
SICI code
0232-1300(1994)29:7<1005:ICFUSF>2.0.ZU;2-3
Abstract
Crystal growth features on stearic acid, potassium nitrate, and potash alum have been determined by means of scanning force microscopy (SFM) . Structures like growth spirals, etch pits, 2D-nuclei, and growth hil locks could be observed. The analysis of the face specific surface top ographies leads to structures which correspond to those expected from kinetic measurements.