R. Krankenhagen et al., OPTICAL AND PHOTOELECTRICAL PROPERTIES OF MU-C-SI LAYERS AND THE INFLUENCE OF SUBSEQUENT HYDROGENATION, Physica status solidi. a, Applied research, 145(2), 1994, pp. 401-406
Differently structured LPCVD-Si films are characterized by SEM, SIMS,
optical transmission and reflection measurements, and photoconductivit
y yield measurements. In comparison to crystalline Si the optical abso
rption is high but the photoconductivity is poor. It is tried to impro
ve the photoconductivity by post-annealing hydrogenation. The treatmen
t with molecular hydrogen has only a small influence on the film prope
rties.