CHARACTERIZATION AND DEPOSITION OF OXIDE-FILMS BY LASER-ASSISTED ELECTRON-BEAM EVAPORATION (LEBE) FOR OPTICAL APPLICATIONS

Citation
P. Thomsenschmidt et al., CHARACTERIZATION AND DEPOSITION OF OXIDE-FILMS BY LASER-ASSISTED ELECTRON-BEAM EVAPORATION (LEBE) FOR OPTICAL APPLICATIONS, Physica status solidi. a, Applied research, 145(2), 1994, pp. 453-460
Citations number
6
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
145
Issue
2
Year of publication
1994
Pages
453 - 460
Database
ISI
SICI code
0031-8965(1994)145:2<453:CADOOB>2.0.ZU;2-S
Abstract
In the laser assisted electron beam evaporation (LEBE) a fused silica substrate is heated by cw CO2 laser irradiation before and during film condensation. HfO2 and Y2O3 films are prepared with this technique. T he optical and structural properties of the coatings are investigated by spectral-photometric transmission measurement (refractive index), l aterally resolved ellipsometry (lateral index and thickness profile ca lculations), and X-ray diffraction (structure). The surface morphology is characterized by lateral force microscopy, a special mode of atomi c force microscopy. Laser damage threshold values are also studied at 248 nm. It is observed that the LEBE deposited films have a rough colu mnar, crystalline structure and increased refractive index and laser d amage threshold values in comparison to amorphous films prepared by co nventional EBE.