HIGH-RESOLUTION DIFFRACTOMETER FOR STRUCTURAL STUDIES OF POLYCRYSTALLINE MATERIALS

Authors
SHMAKOV AN MYTNICHENKO SV TSYBULYA SV SOLOVYEVA LP TOLOCHKO BP
Citation
An. Shmakov et al., HIGH-RESOLUTION DIFFRACTOMETER FOR STRUCTURAL STUDIES OF POLYCRYSTALLINE MATERIALS, Journal of structural chemistry, 35(2), 1994, pp. 224-228
Citations number
7
Categorie Soggetti
Chemistry Inorganic & Nuclear","Chemistry Physical
Journal title
Journal of structural chemistry → ACNP
ISSN journal
00224766
Volume
35
Issue
2
Year of publication
1994
Pages
224 - 228
Database
ISI
SICI code
0022-4766(1994)35:2<224:HDFSSO>2.0.ZU;2-F
Abstract
A high-resolution powder diffraction station with synchroton radiation has been created. The diffractometer was developed on the basis of tw o Microcontrol precision goniometers. The latter provide the independe nt movement of a specimen and a detector with a minimal step of 2theta = 0.001-degree. Using the Si(111) crystal as the analyzer, we obtaine d half widths of the (212), (203), and (301) reflections for alpha-SiO 2 (0.02-0.025-degrees 2theta). The device was tested using alpha-Al2O3 as the standard.