THICKNESS DEPENDENCE OF THE EPITAXIAL STRUCTURE OF VANADYL PHTHALOCYANINE FILM

Citation
H. Hoshi et al., THICKNESS DEPENDENCE OF THE EPITAXIAL STRUCTURE OF VANADYL PHTHALOCYANINE FILM, JPN J A P 2, 33(11A), 1994, pp. 120001555-120001558
Citations number
14
Categorie Soggetti
Physics, Applied
Volume
33
Issue
11A
Year of publication
1994
Pages
120001555 - 120001558
Database
ISI
SICI code
Abstract
We have studied the thickness dependence of the crystal structure in v anadyl phthalocyanine (VOPc) films epitaxially grown on KBr(100) surfa ce. Optical second-harmonic generation observed in oblique incidence i ncreases nearly quadratically with film thickness up to at least 64 nm and saturates, indicating a structural change from an epitaxial polar VO orientation to a nonpolar bulk crystal structure. The latter was a ssigned to monoclinic structure based on X-ray diffraction. Optical ab sorption spectra in visible and infrared regions and scanning electron microscopy also show the structural difference between the films thic ker and thinner than about 80 nm.