The Cd1-xNixTe crystals were grown by the Bridgman method. The investi
gated samples were cut from five different ingots with nominal content
s of nickel varied from 0.005 to 0.05. The investigations were perform
ed using X-ray powder diffraction method and energy dispersive and wav
elength dispersive electron microprobe analysis. The samples were also
examined in a scanning electron microscope. Examinations of wavelengt
h dispersive electron microprobe analysis show that the actual content
s of nickel differ from the nominal values. The solubility limit of ni
ckel was determined to be x = 0.005. The precipitates of NiTe were fou
nd in samples of a greater content of nickel. Their dimensions were be
tween 5 to 90 micrometers. X-ray powder diffraction measurements did n
ot reveal ally significant change of the lattice constant of investiga
ted crystals in comparison with pure CdTe.