CHARACTERIZATION OF INHOMOGENEOUS WEAKLY ABSORBING THIN-FILMS BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY, APPLICATIONS TO HYDROGENATED AMORPHOUS-SILICON FILMS

Authors
CHAHED L FRIGERIO JM JEREMIE F THEYE ML
Citation
L. Chahed et al., CHARACTERIZATION OF INHOMOGENEOUS WEAKLY ABSORBING THIN-FILMS BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY, APPLICATIONS TO HYDROGENATED AMORPHOUS-SILICON FILMS, Journal de physique. IV, 4(C7), 1994, pp. 121-124
Citations number
20
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
4
Issue
C7
Year of publication
1994
Pages
121 - 124
Database
ISI
SICI code
1155-4339(1994)4:C7<121:COIWAT>2.0.ZU;2-6
Abstract
We explore the possibilities offered by transverse photothermal deflec tion spectroscopy at low modulation frequencies for studying variation s of the optical absorption coefficient of hydrogenated amorphous sili con thin films across their thickness, with a special emphasis on the low energy range.