O. Vongeisau et al., SPATIALLY-RESOLVED PHOTOMODULATED MICROWAVE-ABSORPTION AND THERMAL-WAVE IMAGES OF BORON-DOPED SILICON, Journal de physique. IV, 4(C7), 1994, pp. 133-136
A novel imaging technique for semiconductor samples, the photomodulate
d microwave absorption (PMA), is presented. The sample is placed in a
microwave cavity and illuminated with a modulated focussed laser beam.
The excited photo carriers disturb the distribution of the high-frequ
ency electric field in the cavity and therefore change its duality fac
tor. This change is accessible to the experiment. First results on a s
ilicon sample with well defined boron doped areas (10(15) cm(-2)) are
presented and compared to Mirage experiments.