IN-VIVO OPTOTHERMAL MEASUREMENT OF EPIDERMAL THICKNESS

Authors
BINDRA RMS IMHOF RE ECCLESTON GM
Citation
Rms. Bindra et al., IN-VIVO OPTOTHERMAL MEASUREMENT OF EPIDERMAL THICKNESS, Journal de physique. IV, 4(C7), 1994, pp. 445-448
Citations number
4
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
4
Issue
C7
Year of publication
1994
Pages
445 - 448
Database
ISI
SICI code
1155-4339(1994)4:C7<445:IOMOET>2.0.ZU;2-3
Abstract
We report a new opto-thermal method of measuring epidermal thickness i n-vivo, using thermal waves generated within the epidermis which reach the surface after transit delays that depend on depth. The method is illustrated with a thickness map of a forearm, a tape stripping sequen ce and subsequent wound healing.