MICRONIC THERMAL CHARACTERIZATION OF VERTICAL INTERFACES USING THE PHOTOREFLECTANCE METHOD

Authors
LEPOUTRE F FORGE P JOULAND JL PARADIS L ROCHAIS D
Citation
F. Lepoutre et al., MICRONIC THERMAL CHARACTERIZATION OF VERTICAL INTERFACES USING THE PHOTOREFLECTANCE METHOD, Journal de physique. IV, 4(C7), 1994, pp. 571-574
Citations number
2
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
4
Issue
C7
Year of publication
1994
Pages
571 - 574
Database
ISI
SICI code
1155-4339(1994)4:C7<571:MTCOVI>2.0.ZU;2-4
Abstract
This paper presents the theoretical and experimental possibilities of a modulated photothermal method, laser induced photoreflectance, for i nspecting the quality of interfaces with micronic spatial resolutions. An analytical model is established for semi-infinite materials contai ning an internal interface perpendicular to the sample surface. The pr esented application is the detection of thermal resistances in damaged materials.