HEAT-FLOW MEASUREMENT IN THIN-FILMS BY TIME-RESOLVED ELLIPSOMETRY

Authors
ELRHALEB H ROGER JP STEHLE JL BOCCARA AC
Citation
H. Elrhaleb et al., HEAT-FLOW MEASUREMENT IN THIN-FILMS BY TIME-RESOLVED ELLIPSOMETRY, Journal de physique. IV, 4(C7), 1994, pp. 639-642
Citations number
1
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
4
Issue
C7
Year of publication
1994
Pages
639 - 642
Database
ISI
SICI code
1155-4339(1994)4:C7<639:HMITBT>2.0.ZU;2-#
Abstract
Time resolved ellipsometry is applied to investigate heat diffusion pr ocesses occurring in polymer coated silicon under pulsed excitation. E xperimental results, modelisation and analysis are presented.