DEPTH PROFILE OF FERROMAGNETIC LAYERED SAMPLES STUDIED WITH PHOTOTHERMALLY MODULATED MAGNETIC-RESONANCE

Authors
ROMANO JA MANSANARES AM DASILVA EC VARGAS H
Citation
Ja. Romano et al., DEPTH PROFILE OF FERROMAGNETIC LAYERED SAMPLES STUDIED WITH PHOTOTHERMALLY MODULATED MAGNETIC-RESONANCE, Journal de physique. IV, 4(C7), 1994, pp. 667-670
Citations number
8
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
4
Issue
C7
Year of publication
1994
Pages
667 - 670
Database
ISI
SICI code
1155-4339(1994)4:C7<667:DPOFLS>2.0.ZU;2-G
Abstract
Depth profile analysis of a ferromagnetic layered sample composed of g amma-Fe2O3 and CrO2 tapes were performed with photothermally modulated ferromagnetic resonance (PM-FMR). Those analysis were done by using p hase-resolved and modulation frequency variation methods. The experime nts showed the advantages of this technique over the conventional one. The dependency of the detected signal on the modulation frequency was also studied for single layer samples, thus determining the microwave -absorbing layer thickness of the tapes.