Ultrahigh-resolution three-dimensional images of a microscopic test ob
ject were made with soft x-rays collected with a scanning transmission
x-ray microscope. The test object consisted of two different patterns
of gold bars on silicon nitride windows that were separated by simila
r to 5 micrometers. Depth resolution comparable to the transverse reso
lution was achieved by recording nine two-dimensional images of the ob
ject at angles between -50 and +55 degrees with respect to the beam ax
is. The projections were then combined tomographically to form a three
-dimensional image by means of an algorithm using an algebraic reconst
ruction technique. A transverse resolution of similar to 1000 angstrom
s was observed. Artifacts in the reconstruction limited the overall de
pth resolution to similar to 6000 angstroms; however, some features we
re clearly reconstructed with a depth resolution of similar to 1000 an
gstroms.