T. Ahmed et al., LIQUIDUS PROJECTION OF TI-AI-V SYSTEM BASED ON ARC MELTED AND CAST MICROSTRUCTURES, Materials science and technology, 10(8), 1994, pp. 681-690
Are melted and cast microstructures of Ti-Al-Valloys containing 10-57
wt-%Al and 4-46 wt-%V have been characterised using optical, scanning,
and transmission electron microscopy, and room temperature X-ray diff
raction. Chemical compositions of the phases present have been determi
ned using energy dispersive X-ray, and these results have been utilise
d to plot a tentative non-equilibrium liquidus projection of the Ti-Al
-V system. Five ternary peritectic reactions have been shown to be rep
resented within the liquidus projection. These observations have been
utilised to establish the solidification sequences of the Ti-Al-Valloy
s considered.