MERCURY-SENSITIZED HYDROGEN RADICAL PHOTOETCHING OF HYDROGENATED AMORPHOUS-SILICON

Citation
M. Hiramatsu et Y. Kawakyu, MERCURY-SENSITIZED HYDROGEN RADICAL PHOTOETCHING OF HYDROGENATED AMORPHOUS-SILICON, JPN J A P 2, 35(12A), 1996, pp. 1547-1549
Citations number
9
Categorie Soggetti
Physics, Applied
Volume
35
Issue
12A
Year of publication
1996
Pages
1547 - 1549
Database
ISI
SICI code
Abstract
A study of the etching of hydrogenated amorphous silicon films has bee n carried out by using hydrogen radical produced by mercury-photosensi tization of hydrogen gas. There was found it be an incubation period b efore etching began, and the incubation period depended on surface pre treatment conditions. It can be explained that the variation in incuba tion period strongly depend on unevenness of the a-Si:H surface. It ha s also been found that the actual etching rate of undoped a-Si:H incre ases with decreasing the substrate temperature. The authors consider t hat surface reaction, that is, adsorption of hydrogen radical, is domi nant in this etching process.