APPLICATION OF KOHONEN AND SUPERVISED FORCED ORGANIZATION MAPS TO FAULT-DIAGNOSIS IN CMOS OPAMPS

Authors
COLLINS P YU S ECKERSALL KR JERVIS BW BELL IM TAYLOR GE
Citation
P. Collins et al., APPLICATION OF KOHONEN AND SUPERVISED FORCED ORGANIZATION MAPS TO FAULT-DIAGNOSIS IN CMOS OPAMPS, Electronics Letters, 30(22), 1994, pp. 1846-1847
Citations number
2
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
30
Issue
22
Year of publication
1994
Pages
1846 - 1847
Database
ISI
SICI code
0013-5194(1994)30:22<1846:AOKASF>2.0.ZU;2-2
Abstract
Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first us ing multilayer perceptrons and then Kohonen maps to resolve any ambigu ities. A supervised forced organisation map allows the location and re sistance of the short to be determined.