STRUCTURE OF A-SI1-XCX-H ALLOYS BY WIDE-ANGLE X-RAY-SCATTERING - DETAILED DETERMINATION OF FIRST-SHELL AND 2ND-SHELL ENVIRONMENT FOR SI ANDC ATOMS

Authors
MENEGHINI C BOSCHERINI F EVANGELISTI F MOBILIO S
Citation
C. Meneghini et al., STRUCTURE OF A-SI1-XCX-H ALLOYS BY WIDE-ANGLE X-RAY-SCATTERING - DETAILED DETERMINATION OF FIRST-SHELL AND 2ND-SHELL ENVIRONMENT FOR SI ANDC ATOMS, Physical review. B, Condensed matter, 50(16), 1994, pp. 11535-11545
Citations number
67
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
50
Issue
16
Year of publication
1994
Pages
11535 - 11545
Database
ISI
SICI code
0163-1829(1994)50:16<11535:SOAABW>2.0.ZU;2-W
Abstract
We present a study of the structure of a-Si1-xCx:H alloys by wide-angl e x-ray scattering. By carefully analyzing the radial distribution fun ctions and comparing with previous extended x-ray-absorption finestruc ture measurements, we provide a detailed and quantitative description of local bonding around Si and C atoms. Among the results presented, m ost noteworthy are constant interatomic distances in first and second shells and the detection of a strong tendency for chemical order.