SIMULTANEOUS DETECTION OF SECONDARY IONS AND PHOTONS PRODUCED BY THE IMPACT OF KEV POLYATOMIC IONS

(CsII-(n = 0-3), low mass organic negative clusters, and H-, in the 20 -46 keV energy range, have been used in time-of-flight secondary ion m ass spectrometry (TOF-SIMS) experiments to study the relationships bet ween secondary ion and photon emission from a surface. We report on th e simultaneous detection of secondary ions and photons produced by the impact of keV polyatomic ions. Our results indicate that, for a CsI t arget, secondary ions and photons are produced independently of each o ther through different mechanisms. Secondary ion emission is strongly dependent upon the complexity of the primary ion, i.e. monoatomic or p olyatomic. However, photon emission appears to be independent of the p rimary ion's complexity and depends primarily upon the velocity of the primary ion. Unlike the secondary ion yields, no yield enhancements f or the photons were observed due to polyatomic primary ions. Only broa d band light emission from the bulk of the target was observed; no lin e emissions from sputtered species were detected. We compare the yield s of both secondary ions and photons that were collected simultaneousl y, and present a simple model that describes the observed photon yield s as a function of both the electronic and nuclear stopping powers of the primary ion.