J. Ceremuga et al., ANALYSIS OF INFLUENCE OF BUFFER LAYERS ON MICROWAVE PROPAGATION THROUGH HIGH-TEMPERATURE SUPERCONDUCTING THIN-FILMS, Superconductor science and technology, 7(11), 1994, pp. 855-867
Methods of analysis of microwave propagation through superconducting t
hin films with buffer layers on dielectric substrates have been discus
sed. Expressions describing the transmission coefficient S-21 through
the structure and the complex conductivity sigma of a superconductor i
n an analytical form have been derived. The derived equations are vali
d for microwave propagation in waveguides as well as in free space wit
h relevant definition of impedances. Using the obtained solutions, the
influences of buffer layers' parameters (thickness, relative permitti
vity and loss tangent) on the transmission coefficient has been invest
igated using MATLAB. Simulations have been performed for 10 GHz transm
ission through YBa2Cu3O7 films on sapphire with SrTiO3 and CeO2 buffer
layers and on silicon with CaF2 and YSZ buffer layers. To illustrate
the simulations, measurements of the transmission through YBCO film on
sapphire with SrTiO3 buffer layer have been performed. It has been sh
own that even lossy buffer layers have very little impact (smaller tha
n 1% in magnitude and 0.3% in phase) on the transmission coefficient t
hrough superconducting thin films, providing their thickness is below
10 mu m.