INSTRUMENT FOR RESEARCH ON INTERFACES AND SURFACES

We describe an instrument designed for studying the electronic structu re of bulk, surface, and deep solid-solid interface. The analysis is m ade by soft-x-ray emission spectroscopy induced by electron bombardmen t. The target is placed under ultrahigh vacuum and can be prepared and treated in situ. High resolution is achieved both as concerns the pho ton energy and the electron-beam energy. Tests have been made in the d ispersive mode and in the characteristic isochromat mode. In both case s experimental resolution is in good agreement with the expected one.