B. Shen et al., THERMAL RESPONSE OF CMOS-MICROMACHINED THERMISTOR SENSORS UNDER CONSTANT POWER AND CONSTANT-CURRENT EXCITATION, Review of scientific instruments, 65(11), 1994, pp. 3528-3534
The resistance of a micromachined polysilicon thermistor sensor has be
en measured under excitation by both a constant current and constant p
ower step. The time-varying and steady-state response of the polysilic
on resistor at ambient pressures of 1 atm and 10(-4) Torr were observe
d under various step amplitudes. The increase of resistance above its
room-temperature value changed exponentially with time; the time const
ant varied inversely with the square of the current step amplitude but
was constant with power step amplitude. The steady-state change of re
sistance varied linearly with the applied power under both modes of ex
citation. The time-varying and steady-state responses were as predicte
d by a simple analytic model developed. The steady-state operation of
these devices at the two pressures permitted us to directly determine
the energy losses by heat conduction through the surrounding gas and c
onduction through the support arms. At 1 atm, up to 90% of the heat lo
ss is by conduction through the gas. The operation of the device was a
lso simulated numerically and results were obtained in reasonably clos
e agreement with experiment. The simulation also allows us to predict
the amount of heat flow through the various support arms; 70% of the h
eat conducted by the support arms flows through 8 of the 20 support ar
ms.