MAGNETORESISTANCE ANISOTROPY IN EPITAXIAL YBA2(CU1-XZNX)(3)O7-DELTA THIN FILMS

Citation
Jf. Demarneffe et al., MAGNETORESISTANCE ANISOTROPY IN EPITAXIAL YBA2(CU1-XZNX)(3)O7-DELTA THIN FILMS, Superlattices and microstructures, 21, 1997, pp. 323-326
Citations number
15
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
07496036
Volume
21
Year of publication
1997
Supplement
A
Pages
323 - 326
Database
ISI
SICI code
0749-6036(1997)21:<323:MAIEYT>2.0.ZU;2-A
Abstract
The anisotropy of the electrical in-plane resistivity rho(ab) has been investigated for high duality c-asis oriented thin films of YBa2(Cu1- xZnx)(3)O7-delta(x=0.02 and 0.04). The influence of the microstructure of these films on the anisotropic behavior is studied by magnetoresis tance measurements in fields up to 20 Teslass for different angles wit h respect, to the a-b plane at different temperatures below T-c. Scali ng behavior is observed for all temperatures investigated in agreement with the anisotropic effective mass model. (C) 1997 Academic Press Li mited.