DESIGN TECHNIQUE OF TEST PATTERN GENERATO R BASED ON DECIMATION OF M-SEQUENCE PROPERTY

Authors
YARMOLIK VN MURASHKO IA
Citation
Vn. Yarmolik et Ia. Murashko, DESIGN TECHNIQUE OF TEST PATTERN GENERATO R BASED ON DECIMATION OF M-SEQUENCE PROPERTY, Avtomatika i vycislitelnaa tehnika, (1), 1997, pp. 44-56
Citations number
9
Categorie Soggetti
Computer Science Artificial Intelligence
Journal title
Avtomatika i vycislitelnaa tehnika → ACNP
ISSN journal
01324160
Issue
1
Year of publication
1997
Pages
44 - 56
Database
ISI
SICI code
0132-4160(1997):1<44:DTOTPG>2.0.ZU;2-M