GROWTH OF EPITAXIAL BETA-FESI2 THIN-FILMS BY PULSED-LASER DEPOSITION ON SILICON(111)

Citation
Ch. Olk et al., GROWTH OF EPITAXIAL BETA-FESI2 THIN-FILMS BY PULSED-LASER DEPOSITION ON SILICON(111), Journal of materials research, 9(11), 1994, pp. 2733-2736
Citations number
30
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
9
Issue
11
Year of publication
1994
Pages
2733 - 2736
Database
ISI
SICI code
0884-2914(1994)9:11<2733:GOEBTB>2.0.ZU;2-5
Abstract
Epitaxial films of semiconducting iron disilicide (beta -FeSi2) have b een grown by pulsed laser deposition. We find that pulsed laser deposi tion creates conditions favorable to the formation of films with the s mallest geometric misfit possessed by this material system. In situ re flection high energy electron diffraction results indicate a layer by layer growth of the silicide. Analysis of transmission electron diffra ction data has determined that the films are single phase and that thi s growth method reproduces the epitaxial relationship: beta-FeSi2 (001 ) parallel to Si(111).