Ch. Olk et al., GROWTH OF EPITAXIAL BETA-FESI2 THIN-FILMS BY PULSED-LASER DEPOSITION ON SILICON(111), Journal of materials research, 9(11), 1994, pp. 2733-2736
Epitaxial films of semiconducting iron disilicide (beta -FeSi2) have b
een grown by pulsed laser deposition. We find that pulsed laser deposi
tion creates conditions favorable to the formation of films with the s
mallest geometric misfit possessed by this material system. In situ re
flection high energy electron diffraction results indicate a layer by
layer growth of the silicide. Analysis of transmission electron diffra
ction data has determined that the films are single phase and that thi
s growth method reproduces the epitaxial relationship: beta-FeSi2 (001
) parallel to Si(111).