YBCO FILM GROWTH ON ULTRATHIN AG LAYERS

Citation
C. Zhong et al., YBCO FILM GROWTH ON ULTRATHIN AG LAYERS, Journal of materials research, 9(11), 1994, pp. 2761-2763
Citations number
19
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
9
Issue
11
Year of publication
1994
Pages
2761 - 2763
Database
ISI
SICI code
0884-2914(1994)9:11<2761:YFGOUA>2.0.ZU;2-5
Abstract
We discuss our results on the growth of YBCO thin films on ultrathin ( 1-10 nm) Ag underlayers. Substrates were LaAlO3. YBCO was sputter depo sited and Ag thermally evaporated. It was observed that T-c remained r elatively unaffected by the Ag underlayers, ranging from 86-88 K. Crit ical currents were found to be consistent with YBCO grown on bulk Ag w hen the Ag underlayer film reached complete coverage (similar to 9 nm) . Films grown on Ag showed a marked tendency for microcrystalline grow th on the basis of atomic-force microscopy (AFM) results.