ATOMIC-STRUCTURE OF SI TBSI2/(111)SI DOUBLE-HETEROSTRUCTURE INTERFACES/

High-resolution transmission electron microscopy (HRTEM) has been appl ied to study the atomic structure of the Si/TbSi2/(111)Si double-heter ostructure interfaces. The unrelaxed geometrical models of Si/TbSi2/(1 11)Si interfaces can be systematically deduced from the dichromatic co nstrained-coincidence-site-lattice patterns. The atomic structures wer e determined by comparing HRTEM images with computer-simulated images. The relationships of interface bonding and structures of epitaxial Si /TbSi2 and epitaxial TbSi2/Si interfaces are discussed.