SCANNING PROBE MICROSCOPY OF SEMICONDUCTOR SURFACES

Authors
ALLONGUE P
Citation
P. Allongue, SCANNING PROBE MICROSCOPY OF SEMICONDUCTOR SURFACES, Analusis, 22(8), 1994, pp. 130000017-130000019
Citations number
13
Categorie Soggetti
Chemistry Analytical
Journal title
Analusis → ACNP
ISSN journal
03654877
Volume
22
Issue
8
Year of publication
1994
Pages
130000017 - 130000019
Database
ISI
SICI code
0365-4877(1994)22:8<130000017:SPMOSS>2.0.ZU;2-0
Abstract
Imaging semiconductors in real time and in situ during wet processing yields improved understanding on the reactivity of the surface. The na ture of ligands attached to the surface can be identified since the sc anning funneling microscope (STM) images electronic contours.