We present the use of multiwavelength combination sources in a direct
method for improved central fringe identification in a white-light int
erferometric system. The optimum wavelength combinations of such sourc
es can be obtained by the use of the results of a simple analysis. We
find that this multiwavelength technique can greatly reduce the minimu
m signal-to-noise ratio required by the system when used to identify t
he central fringe, and thus it offers an increased signal resolution.
As a result, it is suitable for high-precision measurement purposes as
well as for applications in coherence multiplexed interferometric sen
sor systems.