ORIGINS OF FUNDAMENTAL LIMITS FOR REFLECTION LOSSES AT MULTILAYER DIELECTRIC MIRRORS

Citation
Hr. Bilger et al., ORIGINS OF FUNDAMENTAL LIMITS FOR REFLECTION LOSSES AT MULTILAYER DIELECTRIC MIRRORS, Applied optics, 33(31), 1994, pp. 7390-7396
Citations number
45
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
33
Issue
31
Year of publication
1994
Pages
7390 - 7396
Database
ISI
SICI code
0003-6935(1994)33:31<7390:OOFLFR>2.0.ZU;2-W
Abstract
Fundamental limits on reflection losses are set by internal material l osses associated with the Urbach tail near a band gap and by thermodyn amic density fluctuations in fabrication. In materials such as SiO2 an d TiO2, these limits are of the order of parts in 10(9). The current q uality of supercavity mirrors, in contrast to that of optical fibers, is still far from these limits because of purely technological limitat ions in surface preparation and in the reduction of impurity levels. O vercoming these would greatly benefit, for example, Fabry-Perot interf erometers, ring lasers, and gravitational wave detectors.