Variation of the preparation conditions of porous silicon carbide is s
hown to have a strong effect on the structural and electrical properti
es of the material obtained. A correlation has been observed between t
he fiber size and resistivity of porous SiC, a decrease of fiber size
results in a semi-insulating material due to Fermi-level pinning to su
rface states. A model is proposed for the mechanism of fiber size self
-regulation responsible for the porous material formation. The model r
elates the blocking of the fiber dissolution process to the increase o
f resistivity in a thin fiber due to Fermi-level pinning. We suggest t
hat the Fermi-level pinning model is also applicable to the formation
mechanism of porous silicon. (C) 1994 American Institute of Physics.