MICROANALYSIS OF WELDS USING FIELD-ION MICROSCOPE ATOM-PROBE

Authors
GADGIL VJ KOLSTER BH
Citation
Vj. Gadgil et Bh. Kolster, MICROANALYSIS OF WELDS USING FIELD-ION MICROSCOPE ATOM-PROBE, Polymer-plastics technology and engineering, 33(6), 1994, pp. 691-712
Citations number
34
Categorie Soggetti
Polymer Sciences
Journal title
Polymer-plastics technology and engineering → ACNP
ISSN journal
03602559
Volume
33
Issue
6
Year of publication
1994
Pages
691 - 712
Database
ISI
SICI code
0360-2559(1994)33:6<691:MOWUFM>2.0.ZU;2-O