GROWTH OF HIGHLY ORIENTED BI4TI3O12(104) THIN-FILMS ON AL2O3(0001) SUBSTRATES USING PULSED-LASER DEPOSITION

Authors
Citation
W. Jo et Tw. Noh, GROWTH OF HIGHLY ORIENTED BI4TI3O12(104) THIN-FILMS ON AL2O3(0001) SUBSTRATES USING PULSED-LASER DEPOSITION, Applied physics letters, 65(22), 1994, pp. 2780-2782
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
22
Year of publication
1994
Pages
2780 - 2782
Database
ISI
SICI code
0003-6951(1994)65:22<2780:GOHOBT>2.0.ZU;2-Q
Abstract
Using pulsed laser deposition, Bi4Ti3O12 thin films were grown on Al2O 3(0001) substrates. Laser fluence, substrate temperature, and oxygen p ressure during deposition were varied in wide ranges, and their effect s on Bi4Ti3O12 growth behaviors were investigated. It is possible to g row a Bi4Ti3O12 film whose (104) planes are normal to the Al2O3 c axis . However, the Bi4Ti3O12 film is not grown epitaxially. Instead, it is composed of grains with their c axes along six crystallographic orien tations. This growth behavior of preferential orientations is explaine d in terms of atomic arrangements in the Bi4Ti3O12(104) and the Al2O3( 0001) planes. (C) 1994 American Institute of Physics.