The unambiguous interpretation of measurement results obtained by scan
ning electron acoustic microscopy (SEAM) investigations of GaAs specim
ens is often not possible since the mechanisms which cause the measura
ble electron acoustic signals are not known exactly for GaAs. Therefor
e the signal generation within the often used low-frequency range from
f = 1 kHz to 100 kHz has been evaluated for semi-insulating, undoped
and n-doped GaAs substrates in order to broaden the knowledge about th
e importance of the different possible signal generation mechanisms. I
t has been found that in n-doped GaAs substrate only the thermoelastic
signal generation mechanism is dominant, whereas in a semi-insulating
GaAs substrate an additional contribution of the piezoelectric sound
generation mechanism exists.