SOFT ERROR RATE DEPENDENCE ON MRT FOR THIN-FILM MEDIA

Citation
Oc. Allegranza et Mm. Yang, SOFT ERROR RATE DEPENDENCE ON MRT FOR THIN-FILM MEDIA, IEEE transactions on magnetics, 30(6), 1994, pp. 4005-4007
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
30
Issue
6
Year of publication
1994
Part
1
Pages
4005 - 4007
Database
ISI
SICI code
0018-9464(1994)30:6<4005:SERDOM>2.0.ZU;2-2
Abstract
A study has been conducted to determine the variation of sort error ra te, SER, as a function of the product between remanent magnetization a nd thickness, MrT, for ti;in film media with CoPtCr magnetic layers of three different compositions. Sort error rate as well as macromagneti c characteristics of the three sets of disks were analyzed. The soft e rror rate, measured at linear densities varying from 90 to 130 kBPI wi th a magnetoresistive head, showed a minimum for MrT values ranging be tween 0.6 and 0.7 mcmu/cm(2), depending on the alloy used. For values of MrT smaller than the ones mentioned above, the soft error rate quic kly increased for all the magnetic layers examined because of very low coercivity, while for larger values of MrT the level of degradation, due to drop In resolution and poor overwrite, varied depending on the characteristics of the him, It was also found that, at linear densitie s approaching 130 kBPI the log SER improved up to 5 orders when high c oercivity alloys were used, while at lower linear densities it was pos sible to obtain smaller error rates within a certain MrT range.